[1]史元元,冯 斌,张文博,等.多层阵列式光电坐标靶测量方法研究[J].西安工业大学学报,2019,(06):638-645.[doi:10.16185/j.jxatu.edu.cn.2019.06.003 ]
 SHI Yuanyuan,FENG Bin,ZHANG Wenbo,et al.Research on Measuring Method of Multi-Layer Array Photoelectric Coordinate Target[J].Journal of Xi'an Technological University,2019,(06):638-645.[doi:10.16185/j.jxatu.edu.cn.2019.06.003 ]
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多层阵列式光电坐标靶测量方法研究()
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《西安工业大学学报》[ISSN:1673-9965/CN:61-1458/N]

卷:
期数:
2019年06期
页码:
638-645
栏目:
光电工程
出版日期:
2019-12-25

文章信息/Info

Title:
Research on Measuring Method of Multi-Layer Array Photoelectric Coordinate Target
文章编号:
1673-9965(2019)06-0638-08
作者:
史元元冯 斌张文博胥 磊杨曼曼
(西安工业大学 光电工程学院, 西安 710021
Author(s):
SHI YuanyuanFENG BinZHANG WenboXU LeiYANG Manman
(School of Optoclcctronic Engineering,Xi'an Technological University,Xi'an 710021,China)
关键词:
多层阵列式 光电坐标靶 组合光幕 弹着点坐标 光电器件
Keywords:
multi-layer array photoelectric coordinate target composite curtain bounce point coordinates photoelectric device
分类号:
TH741
DOI:
10.16185/j.jxatu.edu.cn.2019.06.003
文献标志码:
A
摘要:
针对典型光幕组合结构中存在的光路难调节、成本高及精度低等问题,提出了一种用于测量弹着点坐标的多层阵列式光电坐标靶。给出了多层阵列式光电坐标靶的光幕组合结构。利用Solidworks和Tracepro软件分析了光电坐标靶结构中多层光阑板的作用原理。通过理论分析建立了弹着点坐标的数学模型。结合光电器件的输出特性分析了因光电器件间隔距离d造成的测量误差,利用Matlab仿真分析了3 mm光电器件在不同排列方式下的测量误差。研究结果表明:光电器件采用两排的分布方式可有效减小因间隔距离d造成的测量误差; 当d=2 mm时,弹丸的X轴误差最大值不超过1.3 mm,Y轴误差最大值不超过0.9 mm,实现了对弹着点坐标的高精度测量。该测量方法具有精度高、安装调试方便的特点。
Abstract:
In view of the difficult adjustment of light path,high cost and low precision of the typical light screen combination structure,a multi-layer array photoelectric coordinate target is proposed for measuring the coordinates of projectile impact point.The light screen combination structure of the multi-layer array photoelectric coordinate target is built.The principle of the multi-layer diaphragm in the photoelectric coordinate target structure is analyzed with Solidworks and Tracepro softwares.The mathematical model of the coordinates of the impact point is established based on the theoretical analysis.Based on the output characteristics of photoelectric devices,the measurement errors resulting from the distance d between photoelectric devices are analyzed.The measurement errors of 3 mm photoelectric devices in different arrangement modes are simulated by Matlab.The results show that the measurement errors caused by the distance d can be effectively eliminated by using two rows of photoelectric devices.When d=2 mm,the maximum X-axis error of a projectile does not exceed 1.3 mm,and the maximum Y-axis error does not exceed 0.9 mm,which realizes the high-precision measurement.The measurement method is characterized by high accuracy and convenient installation and debugging.

参考文献/References:


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备注/Memo

备注/Memo:
收稿日期:2019-04-29
基金资助:陕西省重点研发计划项目(2017GY026)。 第一作者简介:史元元(1996-),女,西安工业大学硕士研究生。 通信作者简介:冯 斌(1977-),男,西安工业大学副教授,主要研究方向为光电测试技术,E-mail:fengbin98@126.com。 (编辑、校对 潘秋岑)
更新日期/Last Update: 2019-12-25